8797威尼斯老品牌(中国)有限公司-BinG百科8797威尼斯老品牌

Fab EDA

• SPICE Model

  • Baseband Modeling / BSIMProPlus
  • RF Modeling / MeQLab
  • Model Extraction Automation / SDEP
  • Model QA / ME-Pro

• PDK

  • PCell Development / PCellLab
  • PDK Verification / PQLab

• Standard Cell

  • Library Characterization / NanoCell
  • Library Validation / LibWiz

AMS Design EDA

• Design Environment

  • Schematic Capture / NanoDesigner SE
  • Layout Editor / NanoDesigner LS
  • Interactive Physical Verification / NanoDesigner iV
  • Design Optimization / NanoDesigner Optimizer

• Circuit Simulation

  • SPICE Simulator / NanoSpice
  • SPICE Simulator / NanoSpice X
  • SPICE Simulator / NanoSpice Giga
  • FastSPICE Simulator / NanoSpice Pro
  • FastSPICE Simulator / NanoSpice Pro X
  • Mixed Signal / NanoSpice MS
  • Waveform Analysis / NanoWave

• Circuit Analysis

  • Static and Dynamic Circuit Check / NanoSpice CCK
  • Yield Analysis / NanoYield
  • Signal Integrity / NanoSpice SI
  • Critical Path Analysis / PathInspector
  • Power Device Design Verification / PTM
  • ESD Verification / ESDi

Digital Design EDA

• Circuit Simulation

  • Digital Simulation / VeriSim

• Standard Cell

  • Library Characterization / NanoCell
  • Library Validation / LibWiz

• Design & Verification

  • Timing Analysis / TRASTA
  • Floor Planning / NavisPro
  • Signal Integrity Analysis / NanoSpice SI
  • Power Design Analysis / PTM
  • ESD Verification / ESDi
  • Chip-to-Package Connectivity Verification / PadInspector

Testing Systems

• Parametric Testing

  • Semiconductor Parametric Analyzer / FS-Pro
  • Semiconductor Parametric Analyzer / FS800

• Noise Measurement

  • Low Frequency Noise / 9812DX
  • Low Frequency Noise / 9812E
  • Low Frequency Noise / 9813DXC
  • AC Dynamic Noise / 9812AC

• Integrated Testing

  • Electrical Parameter Testing Software / LabExpress

Design Enablement Services

• Wafer Testing

  • Data Testing / Data Acquisition & Characterization

• SPICE Modeling

  • SPICE Modeling / Model Extraction & QA

• Testchip Design

  • Testkey & Layout / Testkey Design & Layout

• New Device

  • New Device / New Device Solutions

• PDK Development

  • PDK / Development & Verification

• IP Development

  • Standard Cell Library & IP Cores / Characterization & Development

DTCO

Design Enablement

IC Simulation & Verification

Full Custom Design

Standard Cell Library Design Acceleration

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